The PV values of eight height differences were 1.5 nm at minimum and 4.7 nm at maximum. When there was a peak in relative line profiles for one combination of two flats, the corresponding peak could Foretinib purchase appear in all absolute line profiles of A, B, and C flats in the three-flat method. The root-mean-square (RMS) values of the relative line profiles in Figure 8a,b,c were 0.41, 0.48, and 0.35 nm, respectively. The repeatability of the PV measurements of a commercial interferometer using a visible light of 632.8-nm wavelength was better than λ/300. It is necessary to compare

the same specification between the near-infrared and visible light interferometers. Figure 8 Height differences between relative line profiles and mean values. For (a) A and B, (b) A and C, and (c) C and B flats. Figure 9 shows the absolute line profiles of

each silicon plane PF-6463922 mirror along the vertical center line at x = 0.0 mm. The relative line profiles were calculated for eight measurements, and the absolute line profiles were calculated for each measurement. The PV values of the absolute line profiles in Figure 9a,b,c were 15.7, 18.4, and 20.6 nm, respectively. The RMS values of the absolute line profiles in learn more Figure 9a,b,c were 3.0, 3.4, and 3.1 nm, respectively. In Figure 9a,b,c, surface waves are observed. The pitch of the surface waves were approximately 0.75 mm. This suggests that the pitch reflects the feed of the MRF polishing. Figure 9 Absolute line profiles of (a) A, (b) B, and (c) C flats for eight measurements. Figure 10 shows the absolute shapes of flats by the three-intersection method. Height differences at the x-y coordinate values (-5, 5) and (5, 5) indicated by open circles in Figure 6d are shown in Table 1. The height differences of the three flats are 4.5 nm or less. The height difference was due to height differences between Aprepitant the relative line profiles and the mean value. This result suggests that the absolute flatness of surfaces can be measured by the three-intersection method by near-infrared interferometry. Figure 10 Absolute shapes of (a) A, (b) B, and (c) C flats by the three-intersection

method. Table 1 Height differences at coordinate values x-y coordinate value Height difference (nm)   A flat B flat C flat (-5, 5) 4.5 4.0 3.4 (5, 5) 1.5 0.4 1.2 Conclusions The authors measured the absolute flatness of three silicon plane mirrors with the three-intersection method using the near-infrared interferometer. The height differences at the x-y coordinate values have been examined to evaluate the precision of the absolute flatness measurement. The height differences of the three flats were 4.5 nm or less. The absolute flatness of the surfaces may be measured through the use of the three-intersection method by near-infrared interferometry. This study represents an initial step toward the measurement of flattened silicon surfaces using a near-infrared interferometer.